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XRD intensity peaks for Nb films on X-cut LTO (circle), X-cut LNO (square), and Z-cut LNO (triangle).
AFM photograph of a 225 nm Nb film on X-cut LNO.
IVC of a junction (area ) on a X-cut LNO substrates at .
Normalized subgap tunnel current as a function of temperature at different subgap bias voltages: 1.5 mV (square), 1 mV (circle), 0.5 mV (triangle up), and 0.1 mV (triangle down). The theoretical curve has been calculated by assuming a BCS electronic density of states for both Nb electrodes.
Experimental results of a junction realized on X-cut LNO and Si substrates.
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