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Examples of the hole patterns etched to create 2D arrays of defect cavities within PhC VCSELs. The lattice constant is 4.0 μm, and the diameter of each of the coupling region holes is (a) 2.8 μm, (b) 1.2 μm, and (c) 0.4 μm.
(a) Light—current characteristic for a device fabricated using the pattern shown in Fig. 1(b). Inset is the near-field image of the device operating just above threshold as a 2D coherently coupled PhC VCSEL.
Spectral characteristics for the device of Fig. 2.
(a)–(c) Far-field images (to scale relative to each other) taken just above threshold from the PhC VCSELs fabricated using the patterns shown in Figs. 1(a)–1(c), respectively. Both (a) and (c) are examples of uncoupled devices with far fields indicative of the superposition of the Gaussian-type beams from each of the operating defect cavities, (b) is indicative of out-of-phase coherent coupling, and is taken from the device of Fig. 2. (d) Simulation of the far-field radiation pattern for the device of Fig. 2, operating out-of-phase coherently coupled.
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