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High-spatial-resolution strain measurements by Auger electron spectroscopy in epitaxial-lateral-overgrowth GaN
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10.1063/1.1929866
/content/aip/journal/apl/86/21/10.1063/1.1929866
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/21/10.1063/1.1929866
/content/aip/journal/apl/86/21/10.1063/1.1929866
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/content/aip/journal/apl/86/21/10.1063/1.1929866
2005-05-20
2014-08-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High-spatial-resolution strain measurements by Auger electron spectroscopy in epitaxial-lateral-overgrowth GaN
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/21/10.1063/1.1929866
10.1063/1.1929866
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