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Reflectance spectra ( polarized) of the three thinnest samples measured at room temperature for ratioed to the substrate reflectance. The spectra are offset vertically for clarity
Measured (dots) and fitted (solid lines) first derivatives of the -polarized reflectance spectra for the three thinnest samples at room temperature.
Variation with Ga fraction of the phonon frequencies of GaAs-like (top) and InAs-like (bottom) modes. The limiting frequency values (squares) at and 1 have been calculated from the phonon frequencies of bulk GaAs and InAs using the method of Ref. 14. The lightly doped substrate results (triangles) are taken from Ref. 10, while the Raman data (dashed lines) are from Ref. 14. The solid lines are best fits to the LO and TO data from epilayers on heavily doped substrates (circles).
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