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X-ray diffraction results of three -based films fabricated on STO (001) substrates. (a) Theta-2theta XRD patterns of the three films with , 0.08 and 0.15. (b) -scan diffraction spectra of the three BFO-based films (, 0.08 and 0.15) and of a STO substrate on (022) planes.
X-ray absorption spectra of a 300 nm-thick epitaxial BFO thin film on a STO (001). Fe K-edge (a) XANES and (b) EXAFS spectra for both in-plane and out-of-plane directions with respect to the linear polarization vector.
XRD patterns of three films (, 0.08 and 0.15) on (022) planes.
Summary of magnetic and ferroelectric properties of BFO-based epitaxial films. (a) In-plane magnetization-field (M–H) curves of the three 300 nm-thick BFO-based films with , 0.08 and 0.15. (b) electrical fatigue-test result of the (i.e., ) film capacitor at a frequency of 1 MHz.
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