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Relaxation of induced polar state in relaxor thin films studied by piezoresponse force microscopy
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10.1063/1.1942635
/content/aip/journal/apl/86/22/10.1063/1.1942635
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1942635
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Dielectric constant and loss factor (inset) of PMN films as a function of temperature and frequency (, 3, 10, 30, and from the upper curve down for and from the lower curve up for .

Image of FIG. 2.
FIG. 2.

Topographic (a) and piezoresponse (b) images of PMN thin film.

Image of FIG. 3.
FIG. 3.

Typical local piezoelectric hysteresis loops measured in the epitaxial part of the film. The arrow indicates the appearance of polar state.

Image of FIG. 4.
FIG. 4.

(a) Time dependence of the induced piezoresponse measured after appying voltage pulses (1) and (2) during . (b) Time dependence of the induced piezoresponse measured after the application of voltage pulses of different durations. The inset shows calculated parameters for KWW dependence in the slow relaxation regime.

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/content/aip/journal/apl/86/22/10.1063/1.1942635
2005-05-26
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relaxation of induced polar state in relaxor PbMg1∕3Nb2∕3O3 thin films studied by piezoresponse force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1942635
10.1063/1.1942635
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