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Magnetic resonance signatures of grown-in defects in GaInNP alloys grown on a GaAs substrate
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10.1063/1.1943487
/content/aip/journal/apl/86/22/10.1063/1.1943487
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943487
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Figures

Image of FIG. 1.
FIG. 1.

(a) PL and (b) ODMR spectra measured at for alloys grown on a GaAs substrate with the specified N contents. The spectrum of the RTA treated sample is shown for comparison. ODMR spectra are normalized by the PL intensity.

Image of FIG. 2.
FIG. 2.

ODMR spectra of the alloy measured at , under the following excitation and detection conditions: (a) excitation wavelength , detection range ; (b) excitation wavelength , detection range ; (c) excitation wavelength , detection range . The spectra are normalized by the PL intensity in the specified detection range.

Image of FIG. 3.
FIG. 3.

Experimental ODMR spectra of the alloy obtained in the X band and W band and results of the fitting using the and defect models and two single-line defects with the parameters, as specified in the text. The fitting curve shown in the figure is obtained using the model. The sign of the signals were reversed for the clarity of presentation.

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/content/aip/journal/apl/86/22/10.1063/1.1943487
2005-05-27
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Magnetic resonance signatures of grown-in defects in GaInNP alloys grown on a GaAs substrate
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943487
10.1063/1.1943487
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