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(a) PL and (b) ODMR spectra measured at for alloys grown on a GaAs substrate with the specified N contents. The spectrum of the RTA treated sample is shown for comparison. ODMR spectra are normalized by the PL intensity.
ODMR spectra of the alloy measured at , under the following excitation and detection conditions: (a) excitation wavelength , detection range ; (b) excitation wavelength , detection range ; (c) excitation wavelength , detection range . The spectra are normalized by the PL intensity in the specified detection range.
Experimental ODMR spectra of the alloy obtained in the X band and W band and results of the fitting using the and defect models and two single-line defects with the parameters, as specified in the text. The fitting curve shown in the figure is obtained using the model. The sign of the signals were reversed for the clarity of presentation.
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