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Exploring extreme particle density and size for blue photoluminescence from as-deposited amorphous Si-in- films
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10.1063/1.1943499
/content/aip/journal/apl/86/22/10.1063/1.1943499
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943499
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Typical electron energy loss spectrum manifesting the chemical purity of the Si-in- deposits. No trace of oxygen contamination can be inferred from this spectrum.

Image of FIG. 2.
FIG. 2.

Transmission electron micrograph of the Si-in- sample with an overall atomic ratio in the as-deposited condition. It manifests a significant homogeneity for the particle size falling within 2.2–2.6 nm with rare exceptions. Here two particles larger than 5 nm can be identified owing to the occasional conglomeration of small ones, since the particle density has approached its possible extreme value.

Image of FIG. 3.
FIG. 3.

(Color online) PL of the Si-in- deposit with an overall atomic ratio plotted against that from a single crystalline GaN sample. Inset shows the digital photo of the two films under illumination of a 6-W ultraviolet lamp. The Si-in- sample (left) is in blue.

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/content/aip/journal/apl/86/22/10.1063/1.1943499
2005-05-26
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Exploring extreme particle density and size for blue photoluminescence from as-deposited amorphous Si-in-SiNx films
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943499
10.1063/1.1943499
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