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Stacking faults in Si nanocrystals
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10.1063/1.1943501
/content/aip/journal/apl/86/22/10.1063/1.1943501
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943501
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) HRTEM image of a typical Si nanoparticle only with SF defects; (b) close-up of the SF.

Image of FIG. 2.
FIG. 2.

(a) Close-up of the SF1; (b)the [011] zone-axis HRTEM image of a typical Si nanoparticle with SFs and nanotwins; (c) close-up of the SF2.

Image of FIG. 3.
FIG. 3.

HRTEM image of a typical Si nanoparticle with a SF parallel to the twin plane.

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/content/aip/journal/apl/86/22/10.1063/1.1943501
2005-05-27
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stacking faults in Si nanocrystals
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/22/10.1063/1.1943501
10.1063/1.1943501
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