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Evidence of native oxides on the capping and substrate of Permalloy gratings by magneto-optical spectroscopy in the zeroth- and first-diffraction orders
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10.1063/1.1944904
/content/aip/journal/apl/86/23/10.1063/1.1944904
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/23/10.1063/1.1944904
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A periodic wire array prepared by lithography of a 12 nm thick Permalloy (NiFe) layer covered by 2 nm thick protecting Cr capping deposited on an Si substrate covered by a native layer. The wire width, , and the wire period, , assume the values of and , respectively. The Cr capping is found completely transformed into a 2 nm thick film due to the aging effect. In the first-diffraction order polar MOKE spectroscopic measurements, the sample is free to rotate about an -oriented axis parallel to the wires axes.

Image of FIG. 2.
FIG. 2.

The zeroth-diffraction order polar MOKE spectra of the sample depicted in Fig. 1. The full and empty circles indicate the experimental values of the azimuth rotation and ellipticity, respectively. The simulated curves are displayed for , the thicknesses of the capping and substrate native oxide layers: and (full lines), and (dashed lines), and and (dotted lines).

Image of FIG. 3.
FIG. 3.

The first-diffraction order polar MOKE spectra of the sample depicted in Fig. 1. The full and empty circles indicate the experimental values of the azimuth rotation and ellipticity, respectively. The simulated curves are displayed for , the thicknesses of the capping and substrate native oxide layers: and (full lines), and (dashed lines), and and (dotted lines).

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/content/aip/journal/apl/86/23/10.1063/1.1944904
2005-06-01
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evidence of native oxides on the capping and substrate of Permalloy gratings by magneto-optical spectroscopy in the zeroth- and first-diffraction orders
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/23/10.1063/1.1944904
10.1063/1.1944904
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