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Absence of the enhanced intra- transition cross section at of in Si-rich
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10.1063/1.1949720
/content/aip/journal/apl/86/24/10.1063/1.1949720
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/24/10.1063/1.1949720
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Cavity ringdown transients for both an SRO:Er sample and a bare quartz substrate detected at upon injection of a pulse at . The experimental configuration is sketched in the inset.

Image of FIG. 2.
FIG. 2.

Optical loss spectra for SRO:Er (annealed at 800 and ) and (annealed at ) measured by CRDS on thin films. All spectra have been corrected for the empty cavity response. Estimates of the background loss are indicated for all spectra (dashed lines).

Image of FIG. 3.
FIG. 3.

(a) PL spectrum of SRO:Er (annealed at ) measured at room temperature under excitation. (b) Er absorption spectra derived both from the optical loss spectrum, by a subtraction of the background (엯), and from the PL spectrum by means of McCumber theory (∎).

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/content/aip/journal/apl/86/24/10.1063/1.1949720
2005-06-08
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Absence of the enhanced intra-4f transition cross section at 1.5μm of Er3+ in Si-rich SiO2
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/24/10.1063/1.1949720
10.1063/1.1949720
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