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(a) Typical x-ray diffraction pattern of the film. The inset shows the rocking curve of the peak. (b) Typical -scan pattern of the film and Si(111) substrate.
(Color online) AFM image of the film surface.
(a) Magnetization curves measured at room temperature with the magnetic field applied in the film plane along the direction. (b) Magnetization curves at very low magnetic fields applied along various crystallographic orientations.
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