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(a) Schematic diagram of ZnO thin-film ridge waveguide random laser with a MgO capped layer. (b) SEM picture of the annealed ZnO thin film after etching a ridge structure by ion-beam sputtering.
(a) Light–light curves and (b) emission spectra of the samples with (엯) and without (●) MgO capped layer measured at room temperature. The length of pump stripe was set to . The inset shows the TE emission far fields of the samples with and without MgO capped layer at pump intensity of . The dashed lines indicate the location of the sample.
Schematic cross section of the annealed ZnO ridge waveguide with MgO capped layer.
Plots of vs for the samples with (dashed line) and without (solid line) MgO capped layer where was measured from the samples by varying from . is used in the plot.
Plots of (solid line) and (dashed line) vs . The solid line is obtained from linear regression fitting within 5% tolerance (i.e., ). is used in the plot.
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