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HRXRD scans for the InGaN∕GaN MQWs grown in the same growth run on (a) LEO -plane GaN, and (b) planar -plane GaN template.
AFM micrograph showing the surface morphology in the Ga-face wing, -face wing, and the window regions of the LEO sample .
(Color) Contour plot of the μ-PL intensity on the wing and window regions of the LEO sample as a function of the wavelength (the intensity is plotted in a logarithmic scale).
(Color online) (a) μ-PL measurements on the Ga-face wing, -face wing, and the window region of the LEO sample; (b) Wide-area PL measurement on the LEO sample and the planar -plane sample.
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