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Controlled fabrication of nanogaps in ambient environment for molecular electronics
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10.1063/1.1857095
/content/aip/journal/apl/86/4/10.1063/1.1857095
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/4/10.1063/1.1857095
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Field-emission SEM micrograph of electrodes before electromigration. (b) Nanogap after electromigration.

Image of FIG. 2.
FIG. 2.

(a) data from a succession of ramps across a junction. Arrows indicate how evolves as the nanogap forms. The ramp up shows the initial ohmic behavior of leads and the downward pattern is the electromigration. (b) Same data with plotted on log scale.

Image of FIG. 3.
FIG. 3.

Fit of Joule-heating model [Eq. (1)] to the electromigration of Au leads.

Image of FIG. 4.
FIG. 4.

(a) Jumps and plateaus in of a metallic neck formed to with the controlled electromigration procedure. The measurements were performed at . Time equal to zero corresponds to the point when the voltage reached . (b) Expanded view of data at location where falls below .

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/content/aip/journal/apl/86/4/10.1063/1.1857095
2005-01-21
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Controlled fabrication of nanogaps in ambient environment for molecular electronics
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/4/10.1063/1.1857095
10.1063/1.1857095
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