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nlinImproving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures
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10.1063/1.1855408
/content/aip/journal/apl/86/6/10.1063/1.1855408
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/6/10.1063/1.1855408
/content/aip/journal/apl/86/6/10.1063/1.1855408
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/content/aip/journal/apl/86/6/10.1063/1.1855408
2005-02-02
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: nlinImproving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/6/10.1063/1.1855408
10.1063/1.1855408
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