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Characterization of heteroepitaxial / electro-optical cell
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10.1063/1.1861121
/content/aip/journal/apl/86/6/10.1063/1.1861121
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/6/10.1063/1.1861121

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction scan for / heterostructure grown onto the single crystal (-cut sapphire). The insert shows “unlocked coupled” scan, where is the angle between (001) and (103) planes in the perovskite structure.

Image of FIG. 2.
FIG. 2.

Rocking curves for NKN(001), LSCO(001), and Bragg reflections for the NKN/LSCO/ heterostructure (same as in Fig. 1). Rocking curve notified as LSCO- with a was recorded for the single LSCO/ layer. The insert shows the -scans of off-normal planes measured at oblique geometry: detector positions , 79.643°, 57.384°; sample positions , 58.065°, 56.167° for NKN(103), LSCO(103), and reflections, respectively.

Image of FIG. 3.
FIG. 3.

Interference spectrum of light normally incident on and reflected from the heteroepitaxial optical cell. Intensity of the reflected light was normalized to the envelop curve function. Inset shows the positions of Fabry–Perot resonances and the dispersion of the refractive index obtained fitting experimental interference minima to the Sellmeier formula.

Image of FIG. 4.
FIG. 4.

Reflectivity data for 655 nm TE and TM modes in: (a) and (c) Au(30 nm)///; (b) //; (d) /. Inset shows schematic representation of electro-optical cell.

Image of FIG. 5.
FIG. 5.

TE guided mode angular spectra at for Au/// film structure. Lower panel: solid and dotted lines show spectra at zero bias and 15 V ; mode resonance line is magnified in the inset. Upper panel: the normalized electro-optic reflectivity .

Tables

Generic image for table
Table I.

Optical characteristics of // film structure.

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/content/aip/journal/apl/86/6/10.1063/1.1861121
2005-01-31
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of heteroepitaxial Na0.5K0.5NbO3/La0.5Sr0.5CoO3 electro-optical cell
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/6/10.1063/1.1861121
10.1063/1.1861121
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