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HRTEM image (after Fourier filtering) of sample B showing the quantum wells.
Raman spectra for different excitation wavelengths for (a) samples A and (b) B, respectively. The arrows show the phonon of the sapphire substrate. The vertical dashed line coincides with the phonon of .
Frequency of the phonon of of sample A vs excitation energy.
PL emission spectra (solid lines) and RRS profiles (dots) of the (a) samples A and (b) B.
Thickness of the quantum wells and barriers and concentration determined by XRD and HRTEM analysis.
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