1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Controlled erbium incorporation and photoluminescence of Er-doped
Rent:
Rent this article for
USD
10.1063/1.1984082
/content/aip/journal/apl/87/1/10.1063/1.1984082
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/1/10.1063/1.1984082
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The and XPS spectra of Er-doped thin films. The ratio represents the ratio of deposition cycles. The XPS spectra for pure and were also shown for comparison.

Image of FIG. 2.
FIG. 2.

The atomic percentage (at. %) of Y and Er measured in Er-doped thin films deposited at various ratio. The composition was determined by ex-situ XPS, thus an ambient contamination of C and 15 at. % O was included in these calculations.

Image of FIG. 3.
FIG. 3.

Room-temperature PL spectra of an as-deposited 320-Å Er-doped film containing 9 at. % Er. The sample was deposited at 350 °C by alternating ten cycles of and five cycles of .

Loading

Article metrics loading...

/content/aip/journal/apl/87/1/10.1063/1.1984082
2005-07-01
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Controlled erbium incorporation and photoluminescence of Er-doped Y2O3
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/1/10.1063/1.1984082
10.1063/1.1984082
SEARCH_EXPAND_ITEM