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SEM image of the region between two posts, showing both single-clamped (cantilever) and double-clamped (bridge) nanowire beam configurations.
Experimental configuration for measuring the mechanical properties of silicon nanowires. (a) Side view of the cantilever nanowire. (b) Side view of the bridge nanowire. The wires were grown from the base end (denoted by B) and are self-welded to the opposing post (denoted by SW). The force in (a) and (b) is applied using an AFM. (c) Nanowire cross sections are typically circular with diameter . (d) The setup used in magnetomotive dynamic measurement of nanowire beam (with length L) resonance frequency.
Magnetomotive oscillation spectra of nanowires for different magnetic fields.
Force vs displacement (load-deflection) behavior measured using AFM for a cantilever silicon nanowire (Sample I in Table I) at from the base end. Young’s modulus is determined from the linear region below 500 nm deflection.
Load-deflection curves obtained for nanowire bridge beams for Samples II and III .
(a) SEM image near base end of nanowires broken during mechanical testing. (b) A higher magnification view of the broken nanowire shown in (a).
Static and dynamic Young’s modulus and maximum bending stress determined using AFM and magnetomotive force measurements.
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