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Growth sequence of active region.
RTPL intensity and spectra as function of flushing time.
TEM image of a five-stack QD active with 4 ML GaP SC layers and flushing.
rms roughness of five-stack obtained from AFM scans as function of In-flushing time. The insets show AFM images of structure without flushing (top), with flushing (middle right), and with flushing (bottom left).
AFM images showing the top layer of uncapped surface QD of five-stack (a) without SC, and (b) with 4 ML GaP SC, (c) with 4 ML GaP SC and In flush and (d) single stack QD.
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