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The plot of the SEE yield of the CNT-dispersed MgO layer as a function of the net PE energy. Inset is the surface image of a scanning electron microscope photograph of the layer where the horizontal scale bar corresponds to .
The plot of amplification gain of the electron-emitting sample employing the CNT-dispersed MgO layer as a function of the net PE energy. The amplified current was collected on the anode and the schematic circuit diagram of the measurement is shown in the inset. The PE energy and anode voltage were fixed as and , respectively, while the sample bias voltage was varied from .
The plot of self-sustaining currents as a function of the sample bias voltage after the PE beam was turned off. The sample bias voltage was varied from and with a step of (solid), then varied again with a step of (open).
Energy spectrum of emitted electrons from the electron emission sample employing the CNT-dispersed MgO layer, where the applied sample bias voltage was and the energy of the initially triggered PEs was .
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