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Refractive index as a function of composition in -doped silica films at the wavelength of 632.8 nm; ●: Experimental data of this work, ∎: Data (from Syms et al.—see Ref. 14). The dashed line is a linear fit of experimental data in this work.
Cross-section SEM image of 3.1 mol % germanium-doped ridge waveguide on thick silica on silicon wafer. The scale bar is in length.
Insertion loss of ridge waveguide sample as a function of the length of waveguide.
Simulated mode profile of ridge waveguide sample. The scale is in dB of light intensity.
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