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Fabrication and optical measurements of germanium-doped silica ridge waveguides using a colloidal suspension approach
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10.1063/1.2037863
/content/aip/journal/apl/87/12/10.1063/1.2037863
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/12/10.1063/1.2037863
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Refractive index as a function of composition in -doped silica films at the wavelength of 632.8 nm; ●: Experimental data of this work, ∎: Data (from Syms et al.—see Ref. 14). The dashed line is a linear fit of experimental data in this work.

Image of FIG. 2.
FIG. 2.

Cross-section SEM image of 3.1 mol % germanium-doped ridge waveguide on thick silica on silicon wafer. The scale bar is in length.

Image of FIG. 3.
FIG. 3.

Insertion loss of ridge waveguide sample as a function of the length of waveguide.

Image of FIG. 4.
FIG. 4.

Simulated mode profile of ridge waveguide sample. The scale is in dB of light intensity.

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/content/aip/journal/apl/87/12/10.1063/1.2037863
2005-09-15
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fabrication and optical measurements of germanium-doped silica ridge waveguides using a colloidal suspension approach
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/12/10.1063/1.2037863
10.1063/1.2037863
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