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Enhanced flux pinning in films by nanoscaled substrate surface roughness
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10.1063/1.2051794
/content/aip/journal/apl/87/12/10.1063/1.2051794
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/12/10.1063/1.2051794
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic drawing illustrating the formation of a nanoscaled corrugated interface between YBCO and twinned LAO substrate. (a) (100) cut and polished LAO at room temperature with natural twin domains. (b) Initial deposition of YBCO films on LAO at , where (100) surface reconstruction at high temperature leads to a corrugation on LAO surface prior to the deposition. (c) The corrugated interface between YBCO and LAO when sample is cooled to room temperature, where possible twin domain motion in LAO is also shown.

Image of FIG. 2.
FIG. 2.

The corresponding MOI, optical microscopy, and AFM taken on the same thick YBCO film strip ( wide). (a) MOI was taken at and external field applied to the ZFC sample. (b) and (c) Optical images, taken at left and right ends of the film strip, respectively, show the twin-free region (b) at the far left end of the strip, while the twin-rich region occupied the rest of the substrate, which included the right end of the strip (c). In the dotted areas, microbridges (shown in enlarged view at bottom) were patterned for direct transport measurement, after MOI and AFM analysis. (d) and (e) AFM images of the film in the twin-free and the twin-rich regions, respectively.

Image of FIG. 3.
FIG. 3.

Temperature dependence of MOI determined in the twin-free (, solid symbols) and the twin-rich (, open symbols) regions. The inset figure shows the relative enhancement at the twin-rich region, while the inset table lists all values determined at using either MOI (M) or direct transport (T) method.

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/content/aip/journal/apl/87/12/10.1063/1.2051794
2005-09-12
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhanced flux pinning in YBa2Cu3O7−δ films by nanoscaled substrate surface roughness
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/12/10.1063/1.2051794
10.1063/1.2051794
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