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(a) Schematic showing the orientation of the films grown on (110)-oriented STO substrate. (b) AFM image showing the rectangular morphology of the films with the long axis along the direction. (c) High-resolution plan-view TEM image of a thick film indicating the presence of two predominant spacings, and , corresponding to the and phases of the RP series, respectively. Diffraction pattern is included as an inset.
Magnetization (a) as a function of temperature at and (b) as a function applied field at for planes (closed symbols) and -axis (open symbols) for a thick film. Data for the target material is shown as a solid line.
(closed symbols) and (open symbols) as a function of temperature for a thick film with planes at 0.0, 2.5, and .
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