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X-ray diffraction scans showing that only reflections of the PSTO film on the (001) MgO substrate appear in the diffraction pattern indicating that the films are -axis oriented. The inset is a rocking curve measurement from the (002) PSTO reflection with the FWHM value of only 0.5°, suggesting that the as-grown PSTO films have excellent single crystallinity.
Cross-sectional TEM studies of the PSTO thin film on MgO substrate with thickness about 300 nm: (a) a low-magnification, bright field TEM image; (b) SAED from the interface covering both the PSTO film and MgO substrate; (c) high resolution TEM image.
Dielectric measurements of the PSTO film on (001) MgO at different frequency at room temperature by Interdigital capacitor technique. The dielectric constant vs bias field shows a very large dielectric tunability and a high dielectric constant with bias dependence described by Lorentz function.
Frequency-dependence of dielectric properties of the PSTO thin films: (left) Zero-bias dielectric constants of the PSTO films decrease as the measurement frequencies increase; (right) Frequency-dependence of tunability of the PSTO films.
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