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Ferroelectric epitaxial thin films on (001) MgO for room temperature high-frequency tunable microwave elements
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View: Figures


Image of FIG. 1.
FIG. 1.

X-ray diffraction scans showing that only reflections of the PSTO film on the (001) MgO substrate appear in the diffraction pattern indicating that the films are -axis oriented. The inset is a rocking curve measurement from the (002) PSTO reflection with the FWHM value of only 0.5°, suggesting that the as-grown PSTO films have excellent single crystallinity.

Image of FIG. 2.
FIG. 2.

Cross-sectional TEM studies of the PSTO thin film on MgO substrate with thickness about 300 nm: (a) a low-magnification, bright field TEM image; (b) SAED from the interface covering both the PSTO film and MgO substrate; (c) high resolution TEM image.

Image of FIG. 3.
FIG. 3.

Dielectric measurements of the PSTO film on (001) MgO at different frequency at room temperature by Interdigital capacitor technique. The dielectric constant vs bias field shows a very large dielectric tunability and a high dielectric constant with bias dependence described by Lorentz function.

Image of FIG. 4.
FIG. 4.

Frequency-dependence of dielectric properties of the PSTO thin films: (left) Zero-bias dielectric constants of the PSTO films decrease as the measurement frequencies increase; (right) Frequency-dependence of tunability of the PSTO films.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ferroelectric (Pb,Sr)TiO3 epitaxial thin films on (001) MgO for room temperature high-frequency tunable microwave elements