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Integration of ferroelectric lead titanate nanoislands for direct hysteresis measurements
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View: Figures


Image of FIG. 1.
FIG. 1.

Scanning electron image of PTO grains on a platinum substrate derived from a 1:5 diluted precursor solution.

Image of FIG. 2.
FIG. 2.

(Color online) As-embedded PTO grains (left) and PTO grains in HSQ after a polishing time (right). The atomic force images (bottom) show the decrease of surface roughness as a result of the polishing step.

Image of FIG. 3.
FIG. 3.

(Color online) PFM images demonstrating the gain of piezoelectric activity with increasing polishing time. The graph inset (bottom left) displays the expected surface fraction of polished PTO grains against the total layer thickness of HSQ, derived from statistical topographic information of the PTO islands.

Image of FIG. 4.
FIG. 4.

(a) Current vs voltage plot of embedded PTO grains (solid) and of a pure HSQ layer of the same thickness (dashed); (b) curve of embedded PTO grains after compensation of leakage and dielectric capacitance contributions.

Image of FIG. 5.
FIG. 5.

Equivalent circuit model for embedded grains of different heights in a dielectric layer.

Image of FIG. 6.
FIG. 6.

Current response of embedded PTO grains on switching and nonswitching pulses. The pulse cycle applied is shown in the top left of the image.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Integration of ferroelectric lead titanate nanoislands for direct hysteresis measurements