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Near-infrared transparent electrodes for precision Teng–Man electro-optic measurements: thin-film electrodes with tunable near-infrared transparency
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10.1063/1.2089184
/content/aip/journal/apl/87/16/10.1063/1.2089184
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/16/10.1063/1.2089184

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (A). Cross-sectional structure of a sandwiched Teng–Man sample. (B) Cross-sectional view of a SAS-based Teng–Man structure.

Image of FIG. 2.
FIG. 2.

(Color online) Transmission optical spectra and carrier concentrations of IAD-derived and ITO thin films grown on 1737F glass substrates. The carrier concentrations and the thicknesses correspond to those for the samples in Table I.

Image of FIG. 3.
FIG. 3.

(Color online) Modulated-beam signal vs applied voltage recorded on an -coated Teng–Man specimen. This electrode corresponds to sample 1 in Table II.

Tables

Generic image for table
Table I.

Physical and electrical properties of IAD-derived and ITO thin films.

Generic image for table
Table II.

Experimental results for using 140 nm and ITO electrodes in direct Teng–Man EO measurements at 1310 nm.

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/content/aip/journal/apl/87/16/10.1063/1.2089184
2005-10-13
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near-infrared transparent electrodes for precision Teng–Man electro-optic measurements: In2O3 thin-film electrodes with tunable near-infrared transparency
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/16/10.1063/1.2089184
10.1063/1.2089184
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