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(Color online) (A). Cross-sectional structure of a sandwiched Teng–Man sample. (B) Cross-sectional view of a SAS-based Teng–Man structure.
(Color online) Transmission optical spectra and carrier concentrations of IAD-derived and ITO thin films grown on 1737F glass substrates. The carrier concentrations and the thicknesses correspond to those for the samples in Table I.
(Color online) Modulated-beam signal vs applied voltage recorded on an -coated Teng–Man specimen. This electrode corresponds to sample 1 in Table II.
Physical and electrical properties of IAD-derived and ITO thin films.
Experimental results for using 140 nm and ITO electrodes in direct Teng–Man EO measurements at 1310 nm.
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