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Relaxation of biaxial tensile strain in ultrathin metallic films: Ductile void growth versus nanocrystalline domain formation
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10.1063/1.2108128
/content/aip/journal/apl/87/17/10.1063/1.2108128
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/17/10.1063/1.2108128
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Top view of the surface of a strained metallic thin film with an area of under an applied biaxial strain of (a) 9% with a central void, (b) 12% with a central void, and (c) 12% without a central void. (d) 3D close view of the material within the yellow frame in (c) with a surface area of . The configurations are snapshots at , where is time in the MD simulation. Atoms are colored according to their potential energy.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Evolution of potential energy per atom in the metallic thin film under biaxial tensile strains , 9%, 10%, and 12% with a central void in the film, and without a central void. (b) Dependence on the applied biaxial tensile strain of void volume in the strained metallic thin film at steady state; denotes the initial void volume.

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/content/aip/journal/apl/87/17/10.1063/1.2108128
2005-10-19
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relaxation of biaxial tensile strain in ultrathin metallic films: Ductile void growth versus nanocrystalline domain formation
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/17/10.1063/1.2108128
10.1063/1.2108128
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