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XRD patterns for a 1600Å thick film grown on glass substrate.
The HREM overview image of the interface region for a film. Between the glass substrate (indicated by Arrow 1) and well-ordered layered film (indicated by Arrow 2), there is an amorphous region where the composition is related to that of .
(a) The HREM image of the film grown on glass substrate, showing the layered structure. (b) The HREM image of a film region consisting of a stacking fault and a second phase material, indicated by Arrows 1 and 2, respectively.
The temperature dependence of the (a) resistivity and (b) thermoelectric power for films on glass substrate (closed circle) and Si (100) substrate (open circle). An expanded view of (a) is shown as an inset.
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