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Thermoelectric properties and microstructure of -axis-oriented thin films on glass substrates
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10.1063/1.2117615
/content/aip/journal/apl/87/17/10.1063/1.2117615
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/17/10.1063/1.2117615
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns for a 1600Å thick film grown on glass substrate.

Image of FIG. 2.
FIG. 2.

The HREM overview image of the interface region for a film. Between the glass substrate (indicated by Arrow 1) and well-ordered layered film (indicated by Arrow 2), there is an amorphous region where the composition is related to that of .

Image of FIG. 3.
FIG. 3.

(a) The HREM image of the film grown on glass substrate, showing the layered structure. (b) The HREM image of a film region consisting of a stacking fault and a second phase material, indicated by Arrows 1 and 2, respectively.

Image of FIG. 4.
FIG. 4.

The temperature dependence of the (a) resistivity and (b) thermoelectric power for films on glass substrate (closed circle) and Si (100) substrate (open circle). An expanded view of (a) is shown as an inset.

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/content/aip/journal/apl/87/17/10.1063/1.2117615
2005-10-19
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermoelectric properties and microstructure of c-axis-oriented Ca3Co4O9 thin films on glass substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/17/10.1063/1.2117615
10.1063/1.2117615
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