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Transient-current measurement of the trap charge density at interfaces of a thin-film metal∕ferroelectric∕metal structure
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10.1063/1.2125122
/content/aip/journal/apl/87/19/10.1063/1.2125122
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/19/10.1063/1.2125122
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Thin-film M∕PZT∕M under positive bias applied to contact No. 1: (a) band diagram; the distributions of (b) potential and (c) electric field within the FF.

Image of FIG. 2.
FIG. 2.

The trap density vs the trap level energy at interface, . Points, experimental data. The curve indicates the trap density profile, arrows indicate the range of accuracy, .

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/content/aip/journal/apl/87/19/10.1063/1.2125122
2005-10-31
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transient-current measurement of the trap charge density at interfaces of a thin-film metal∕ferroelectric∕metal structure
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/19/10.1063/1.2125122
10.1063/1.2125122
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