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X-ray diffraction patterns of 0.8NBT–0.2KBT thin films on (a) and (b) Si substrates, annealed at 700 °C for 10 min, respectively.
(a) - hysteresis loops for 0.8NBT–0.2KBT films on substrate at three different voltages. (b) the fatigue test results determined using a fatigue voltage of and a measuring voltage of 2.5 V at a frequency of 250 kHz.
(a) Applied voltage dependencies on the - curves of MFS capacitor. (b) - characteristics of MFS at various dc voltage ramp rate at applied bias voltages.
Temperature dependence of capacitance at various frequencies for 0.8NBT–0.2KBT thin films deposited on Si substrate.
Dielectric constant and dissipation factor of MFM capacitor as a function of frequency.
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