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(a) AFM scan of the photoinduced structures obtained by normal incidence irradiation of a DR1MA/MMA thin film with a circularly polarized light. (b) Fourier transform of the AFM profile. The thickness of the sample was . The laser beam intensity and wavelength were, respectively, and . The irradiation time was .
The structure of the light-emitting device: a rubrene-doped light-emitting layer is evaporated onto the aluminum-coated DR1MA/MMA structured polymer film. The outcoupled light from the device resulting from photoexcitation of the luminescent layer with uv light is collected by an optical fiber set at an angle from normal incidence and analyzed by a spectrometer. Only one part of the polymer surface is patterned for comparison with a nonpatterned structure. The sample can be rotated around different axes: out of plane (angle ) or in plane (angle ). Thicknesses of the DR1MA/MMA, aluminum and layers were, respectively, equal to 500, 100, and .
Fluorescence spectra showing a modification of the light emission following structuration of the emitting layer for different sample rotation angles. The position of the optical fiber detector was fixed (angle in Fig. 2). In Fig. 3(a), and light is collected for variable out-of-plane rotation angles . In Fig. 3(b), and light is collected for variable in-plane rotation angles . The period of the structures was and their modulation amplitude after evaporation of both aluminum and luminescent layers. The fluorescence spectrum collected from the nonpatterned part of the device is also shown.
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