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XPS Zn narrow scan and valence band spectrum of -plane sapphire and ZnO substrate.
Core-level survey spectra of ZnCdO, 1 nm layer of ZnCdO on ZnO, and a ZnO substrate using a pass energy of 187.85 eV at takeoff angle of 65°.
Energy band diagram of thin heterojunction interface. is the corresponding core-level separation measured across the interface.
Values of band offsets determined in our experiments.
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