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Measurement of (0001) heterojunction band offsets by x-ray photoelectron spectroscopy
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10.1063/1.2128477
/content/aip/journal/apl/87/19/10.1063/1.2128477
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/19/10.1063/1.2128477

Figures

Image of FIG. 1.
FIG. 1.

XPS Zn narrow scan and valence band spectrum of -plane sapphire and ZnO substrate.

Image of FIG. 2.
FIG. 2.

Core-level survey spectra of ZnCdO, 1 nm layer of ZnCdO on ZnO, and a ZnO substrate using a pass energy of 187.85 eV at takeoff angle of 65°.

Image of FIG. 3.
FIG. 3.

Energy band diagram of thin heterojunction interface. is the corresponding core-level separation measured across the interface.

Tables

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Table I.

Values of band offsets determined in our experiments.

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/content/aip/journal/apl/87/19/10.1063/1.2128477
2005-11-03
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of Zn0.95Cd0.05O∕ZnO (0001) heterojunction band offsets by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/19/10.1063/1.2128477
10.1063/1.2128477
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