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Microscale application of column theory for high resolution force and displacement sensing
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10.1063/1.1989440
/content/aip/journal/apl/87/2/10.1063/1.1989440
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/2/10.1063/1.1989440

Figures

Image of FIG. 1.
FIG. 1.

(a) Post buckling geometry; (b) axial force vs lateral displacement plot.

Image of FIG. 2.
FIG. 2.

(a) SEM micrograph of the device; (b) optical micrograph of buckled configuration; (c) specimen fixture schematic; (d) freestanding carbon nanotube specimen; (e) biological cell specimen.

Image of FIG. 3.
FIG. 3.

Lateral displacement vs applied displacement loading–calibration plots.

Image of FIG. 4.
FIG. 4.

Lateral displacement vs applied displacement loading–experiment with cantilever.

Tables

Generic image for table
Table I.

Results of FEA simulations for varying parameters.

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/content/aip/journal/apl/87/2/10.1063/1.1989440
2005-07-07
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microscale application of column theory for high resolution force and displacement sensing
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/2/10.1063/1.1989440
10.1063/1.1989440
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