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(a) Typical SEM image of nanoflakes on an AFM tip. Inset shows a high magnification SEM image of the tip apex. (b) XPS spectra of and from as-grown samples.
(a) Typical TEM image of nanoflakes on an AFM tip. (b) HRTEM image from a long nanoflake. From it, the lattice fringe is measured as about , consistent with the interplanar spacings of both (104) and in . The inset shows corresponding SAED pattern, which can be indexed with crystal zone of .
Schematic of FE setup.
(a) FE curve and fitting curves based on FN equation. (b) FN plots corresponding to the experimental data in (a).
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