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Efficient field emission from nanoflakes on an atomic force microscope tip
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10.1063/1.1991978
/content/aip/journal/apl/87/2/10.1063/1.1991978
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/2/10.1063/1.1991978
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Figures

Image of FIG. 1.
FIG. 1.

(a) Typical SEM image of nanoflakes on an AFM tip. Inset shows a high magnification SEM image of the tip apex. (b) XPS spectra of and from as-grown samples.

Image of FIG. 2.
FIG. 2.

(a) Typical TEM image of nanoflakes on an AFM tip. (b) HRTEM image from a long nanoflake. From it, the lattice fringe is measured as about , consistent with the interplanar spacings of both (104) and in . The inset shows corresponding SAED pattern, which can be indexed with crystal zone of .

Image of FIG. 3.
FIG. 3.

Schematic of FE setup.

Image of FIG. 4.
FIG. 4.

(a) FE curve and fitting curves based on FN equation. (b) FN plots corresponding to the experimental data in (a).

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/content/aip/journal/apl/87/2/10.1063/1.1991978
2005-07-07
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Efficient field emission from α-Fe2O3 nanoflakes on an atomic force microscope tip
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/2/10.1063/1.1991978
10.1063/1.1991978
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