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X-ray diffraction pattern around 222 peak of superlattice film. Pattern shows two orders of SL reflections as well as the peaks for the substrate and PbTe buffer.
Transmission electron micrograph of SL with period. Apparent kinks in epitaxial layers originate in the substrate, , which exhibits subsurface polishing damage after preparation by DI water etch.
Lattice thermal conductivity for different superlattice periods of films compared to single PbTe and alloy films.
(a) Mobility of various SL films compared to PbTe and alloy film. Carrier concentration is for all films. (b) Temperature-dependent mobility–carrier concentration product of superlattice structures compared to single PbTe and films.
Temperature-dependent figure-of-merit data for SL, quantum dot (QDSL), and bulk PbTe. Note that the of 0.63 that we observe is for cross-plane direction. The instrinsic is estimated also for cross-plane direction, and appears similar to those observed for PbTe QDSL.
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