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Wettability control using nanoscale structures fabricated by probe oxidation. (a) Schematic of the oxide ridge structure and the thin liquid. (b) AFM image of the fabricated oxide ridges. (c) AFM image of the about -thick liquid applied to the oxide structure shown in (b). The oxide ridges shed the thin liquid. The bulk viscosity of the liquid was and the surface energy was .
AFM images of patterned liquids with a thickness of about . (a) Swirl-shaped liquid pattern. Note that the liquid line connects the inlet point and the center of the swirl. (b) Narrow liquid lines. The minimum width of the lines is about . (c) Array of nanodroplets or nanoliquid dots that are separated by oxide ridges.
Cross-sectional view of AFM images of oxide ridges (dotted line) and liquid (solid line). The heights of oxide ridges are about 2.8, 2.5, 1.6, 1.5, 1.3, and from the left ridges to the right ones.
Measured relationship between the spreading coefficient and the oxide layer thickness.
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