1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Hole transport and carrier lifetime in InN epilayers
Rent:
Rent this article for
USD
10.1063/1.2133892
/content/aip/journal/apl/87/21/10.1063/1.2133892
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/21/10.1063/1.2133892
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The grating diffraction efficiency as a function of the probe delay time at the front side (a) and the back side (b) shown for different grating periods. Open circles show experimentally measured data. Solid lines indicate the single exponential fit.

Image of FIG. 2.
FIG. 2.

Inverse grating decay time as a function of . Values of ambipolar diffusion coefficient, , and recombination lifetime, , were obtained from the linear fit (dashed line) according to Eq. (2).

Loading

Article metrics loading...

/content/aip/journal/apl/87/21/10.1063/1.2133892
2005-11-15
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Hole transport and carrier lifetime in InN epilayers
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/21/10.1063/1.2133892
10.1063/1.2133892
SEARCH_EXPAND_ITEM