Full text loading...
(a) Scanning electron microscope (SEM) image of the sample used to study the spreading of the MS-SPP modes. (b) PSTM image recorded above the white dashed perimeter on (a).
(a) SEM image of the typical configuration used to measure bent losses. (b) (resp. (c)) PSTM image of the straight (resp. bent) waveguides. (d) Longitudinal PSTM profiles recorded over the input and output strips of the reference (solid line) and bent (dashed line) waveguides. The input profile of the bent waveguide is multiplied by the input levels ratio . The same coefficient has been applied to the output profile of the bent MS.
(a) SEM image of an integrated Bragg mirror (10 lines, , distance ). (b) Large scan PSTM image of the bent strip equipped with the mirror shown in (a).
(a) SEM image of a MS based SPP splitter. (b) Large scan PSTM image of the splitter. The intensity of the scattering spot is the same at the end of both branches of the splitter.
Article metrics loading...