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(a) on log-log scale for insulating sample annealed at various temperatures. Dashed line: As-grown; solid lines: After annealing. Inset: Same data plotted as vs . (b) FOM vs for this sample unannealed and on annealing and for metallic composition (13 at. % Nb) unannealed.
(a) of initially metallic (13 at. %Nb) sample after annealing at various . Inset: Same data shown as vs .
Comparison of data from Fig. 2 (dotted lines) with of as-grown for and Nb (solid lines).
High magnification XTEM of -Nb–Si (a) unannealed, and after annealing at: (b) 200 °C, and (c) 500 °C. Circles show examples of clusters of fringes.
(a) ADF image of -Nb–Si annealed at 500 °C (b) EDX spectrum profiles showing Nb, Si, and ratios at positions along the line shown in (a). Values for ratios are significant; separate numbers are affected by varying thickness. Positions 1, 2, and 3 are shown in (a) and noted in (b); bright spots in ADF image are regions of higher than average Nb concentration.
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