banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Beneficial effects of annealing on amorphous Nb–Si thin-film thermometers
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

(a) on log-log scale for insulating sample annealed at various temperatures. Dashed line: As-grown; solid lines: After annealing. Inset: Same data plotted as vs . (b) FOM vs for this sample unannealed and on annealing and for metallic composition (13 at. % Nb) unannealed.

Image of FIG. 2.
FIG. 2.

(a) of initially metallic (13 at. %Nb) sample after annealing at various . Inset: Same data shown as vs .

Image of FIG. 3.
FIG. 3.

Comparison of data from Fig. 2 (dotted lines) with of as-grown for and Nb (solid lines).

Image of FIG. 4.
FIG. 4.

High magnification XTEM of -Nb–Si (a) unannealed, and after annealing at: (b) 200 °C, and (c) 500 °C. Circles show examples of clusters of fringes.

Image of FIG. 5.
FIG. 5.

(a) ADF image of -Nb–Si annealed at 500 °C (b) EDX spectrum profiles showing Nb, Si, and ratios at positions along the line shown in (a). Values for ratios are significant; separate numbers are affected by varying thickness. Positions 1, 2, and 3 are shown in (a) and noted in (b); bright spots in ADF image are regions of higher than average Nb concentration.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Beneficial effects of annealing on amorphous Nb–Si thin-film thermometers