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Beneficial effects of annealing on amorphous Nb–Si thin-film thermometers
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10.1063/1.2135380
/content/aip/journal/apl/87/22/10.1063/1.2135380
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/22/10.1063/1.2135380
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) on log-log scale for insulating sample annealed at various temperatures. Dashed line: As-grown; solid lines: After annealing. Inset: Same data plotted as vs . (b) FOM vs for this sample unannealed and on annealing and for metallic composition (13 at. % Nb) unannealed.

Image of FIG. 2.
FIG. 2.

(a) of initially metallic (13 at. %Nb) sample after annealing at various . Inset: Same data shown as vs .

Image of FIG. 3.
FIG. 3.

Comparison of data from Fig. 2 (dotted lines) with of as-grown for and Nb (solid lines).

Image of FIG. 4.
FIG. 4.

High magnification XTEM of -Nb–Si (a) unannealed, and after annealing at: (b) 200 °C, and (c) 500 °C. Circles show examples of clusters of fringes.

Image of FIG. 5.
FIG. 5.

(a) ADF image of -Nb–Si annealed at 500 °C (b) EDX spectrum profiles showing Nb, Si, and ratios at positions along the line shown in (a). Values for ratios are significant; separate numbers are affected by varying thickness. Positions 1, 2, and 3 are shown in (a) and noted in (b); bright spots in ADF image are regions of higher than average Nb concentration.

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/content/aip/journal/apl/87/22/10.1063/1.2135380
2005-11-21
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Beneficial effects of annealing on amorphous Nb–Si thin-film thermometers
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/22/10.1063/1.2135380
10.1063/1.2135380
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