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TEM image of a screw dislocation, , and a nanopipe, , imaged in bright field under two-beam conditions with (arrowed). The inset shows more clearly the faceting of the voids.
TEM image of a series of dislocation loops with Burgers vectors of type, which are believed to be due to the collapse of a dipole consisting of parallel screw dislocations following the dashed lines. The insets (a) and (b) show nanopipes with occasional pinched sections that extend along the full length of the dashed lines.
STEM analysis of an end-on nanopipe in a sample (a) , O–K, and N–K profiles from an EELS line scan; (b) HAADF (high angle annular dark field) image; and (c) bright field image of the nanopipe. Points 1–4 in (b) show corresponding points in (a).
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