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Improved thin films using oxygen relaxation technique
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10.1063/1.2136432
/content/aip/journal/apl/87/22/10.1063/1.2136432
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/22/10.1063/1.2136432

Figures

Image of FIG. 1.
FIG. 1.

Typical XRD pattern of the YBCO/STO/LAO multilayered structure.

Image of FIG. 2.
FIG. 2.

SPM images of the STO film surface measured for: (a) Sample No. 1 (without oxygen relaxation); scale in direction is /div. and (b) Sample No. 5 (with seven oxygen relaxations); scale in direction is /div.

Image of FIG. 3.
FIG. 3.

Typical and -voltage characteristics measured at (a) , , and (b) , .

Tables

Generic image for table
Table I.

Measurement results.

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/content/aip/journal/apl/87/22/10.1063/1.2136432
2005-11-21
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Improved SrTiO3 thin films using oxygen relaxation technique
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/22/10.1063/1.2136432
10.1063/1.2136432
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