Full text loading...
Cross-sectional STEM bright field images viewed. (a) Entire region and (b) magnified image of the area designated by the dotted rectangle on the plane. The broken line in (a) indicates the original shape.
(Color) Position dependence of the CL peak wavelength of the SQW. The error bars represent the emission line widths. The lower inset is a SEM image and monochromatic FLM images monitored at 458, 532, and 628 nm, while the upper inset shows a schematic sample structure where the arrow indicates the measurement direction.
(Color) PL spectrum of the SQWs measured at RT. The background color is equivalent to the emission colors.
Temperature dependence of the integrated PL intensity. The results for the SQWs (▴) and conventional (0001) SQW (엯) are shown. The intensities are normalized by that at 13 K.
PL decay curves of SQWs at 13 K monitored at 460 nm (blue), 530 nm (green), and 575 nm (amber). For comparison, the inset shows that for conventional (0001) SQW.
Article metrics loading...