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Segregation-induced grain boundary premelting in nickel-doped tungsten
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10.1063/1.2138796
/content/aip/journal/apl/87/23/10.1063/1.2138796
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/23/10.1063/1.2138796
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Figures

Image of FIG. 1.
FIG. 1.

(a) Original and (b) digitally enhanced HRTEM images of a disordered GB in a at. % Ni specimen annealed at 1400 °C. The inset in (a) is the W–Ni phase diagram (see Ref. 12), in which the specimen conditions are indicated. The two insets at the top-left corner of (b) are expanded views of selected regions; the inset at the bottom of (b) is an image of a different area. The digital enhancement process includes a background removal using fast Fourier transform pass band filtering with a aperture plus some brightness and contrast adjustments, which should not disturb any ordered or disordered features .

Image of FIG. 2.
FIG. 2.

(a) ratio vs sputtering time for a at. % Ni specimen, annealed at 1400 °C. (b) ratio at fractured GBs, and relative GB Ni excess, vs overall Ni content for specimens annealed at 1400 °C. The relative GB excesses are represented by the integrated area under ratio vs sputtering time [e.g., the shaded area in (a)].

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/content/aip/journal/apl/87/23/10.1063/1.2138796
2005-11-28
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Segregation-induced grain boundary premelting in nickel-doped tungsten
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/23/10.1063/1.2138796
10.1063/1.2138796
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