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(Color online) Schematic structure of multilayered structure containing Sb-QD active medium and silicon prism.
Total reflection measurement setup with hemispherical Si prism for observing RPT effect in multilayered semiconductor structures.
RPT effect in multilayered structure irradiating TE and TM polarized photons: (a) theoretical and (b) experimental results.
(Color online) (a) Shift of resonant-incidence angle with and without control light irradiation. (b) All-optically controlled reflectance around resonant-incidence angle.
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