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Electron micrograph of modulated pores in silicon with a defect layer. The lattice constant is . The picture shows a tilted bird’s-eye view of the structure. The pore width varies along the pore axis between and . The defect has a length of .
Calculated band diagram of the 3D structure without a defect. The first band gap is at and the second at . This corresponds to and , respectively.
(a) Experimental transmission spectra along the direction. (b) Comparison of the relative positions of the experimental and calculated spectra.
Temperature-induced shift of the peak wavelength of the defect mode. The accuracy of the data is .
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