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Reduction of damage threshold in dielectric materials induced by negatively chirped laser pulses
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10.1063/1.2140476
/content/aip/journal/apl/87/24/10.1063/1.2140476
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/24/10.1063/1.2140476
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic diagram of the experimental setup.

Image of FIG. 2.
FIG. 2.

(Color online) Threshold damage fluence as a function of the pulse duration in fused silica (circles) and (crosses), for positive (solid red line), and negative (dashed blue line) chirp.

Image of FIG. 3.
FIG. 3.

(Color online) The calculated electron density as a function of time for fused silica irradiated with a 100 fs pulse with an intensity of for positive (solid red line) and negative (dashed blue line) chirp.

Image of FIG. 4.
FIG. 4.

(Color online) The impact ionization rates (positive chirp—solid red, negative chirp—dashed blue) and multiphoton ionization rates (positive chirp—red dashed-dotted, negative chirp—blue dotted) for fused silica irradiated at 100 fs, .

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/content/aip/journal/apl/87/24/10.1063/1.2140476
2005-12-05
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reduction of damage threshold in dielectric materials induced by negatively chirped laser pulses
http://aip.metastore.ingenta.com/content/aip/journal/apl/87/24/10.1063/1.2140476
10.1063/1.2140476
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