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(a) Sketch of the directions of the sample and laser polarization. The bars on the and axis indicate the polarization of the laser beam; (b) and (c) are the confocal transmission image and the depth scanning confocal reflection image of a single void dot, respectively; (d) is the AFM image of the voids; (e) is the sideview confocal transmission image of void dots fabricated at various depths with the same power.
(a), (c) Comparison of voids fabricated near threshold (left void) and far beyond threshold (right void) for the and directions, respectively; (b), (d) transmission image of void dots at different depths fabricated near threshold in the and directions, respectively; (e) maximum fabrication depths as a function of input power in the and directions.
(a), (b) Confocal transmission images of voids fabricated with different input powers in the and directions, respectively; (c) transverse diameters of the voids as a function of the input power in the and directions; (d), (e) transmission images of voids fabricated with different exposure times in the and directions, respectively.
(a) Transmission spectra of a -thick crystal; (b) the wavelength response and (c) spectra distribution response of the microexplosion in the and directions.
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