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(a) AFM image of 2D corrugated silicon substrate with of grating period. (b) Configuration of the corrugated device structure.
Angular dependence of EL intensity in the control OLEDs with -thick (dot) and -thick (solid) layers.
(a) Angular dependence of EL intensity of devices A, B, and C. (b) Energy vs wave vector for the calculated silver/air interface SP dispersion relation of device A (triangles), device B (circles), and device C (squares) (left) and EL spectrum of TEOLED (right).
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